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Near edge x-ray absorption fine structure study of aligned pi-bonded carbon structures in nitrogenated ta-C films

Roy, SS, McCann, R, Papakonstantinou, P, McLaughlin, JA, Kirkman, IW, Bhattacharyya, S and Silva, SRP (2006) Near edge x-ray absorption fine structure study of aligned pi-bonded carbon structures in nitrogenated ta-C films JOURNAL OF APPLIED PHYSICS, 99 (4). ? - ?. ISSN 0021-8979

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Item Type: Article
Uncontrolled Keywords: Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED, TETRAHEDRAL AMORPHOUS-CARBON, THIN-FILMS, BONDING MODIFICATIONS, DEFECT DENSITY, NITRIDE, RAMAN, SPECTROSCOPY, REDUCTION, EMISSION, SPECTRA
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Divisions: Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Nano-Electronics Centre
Depositing User: Mr Adam Field
Date Deposited: 27 May 2010 14:09
Last Modified: 27 Sep 2014 13:35
URI: http://epubs.surrey.ac.uk/id/eprint/463

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