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Near edge x-ray absorption fine structure study of aligned pi-bonded carbon structures in nitrogenated ta-C films

Roy, SS, McCann, R, Papakonstantinou, P, McLaughlin, JA, Kirkman, IW, Bhattacharyya, S and Silva, SRP (2006) Near edge x-ray absorption fine structure study of aligned pi-bonded carbon structures in nitrogenated ta-C films JOURNAL OF APPLIED PHYSICS, 99 (4). ? - ?. ISSN 0021-8979

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Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Nano-Electronics Centre
Authors :
AuthorsEmail
Roy, SSUNSPECIFIED
McCann, RUNSPECIFIED
Papakonstantinou, PUNSPECIFIED
McLaughlin, JAUNSPECIFIED
Kirkman, IWUNSPECIFIED
Bhattacharyya, SUNSPECIFIED
Silva, SRPUNSPECIFIED
Date : 15 February 2006
Identification Number : 10.1063/1.2173046
Uncontrolled Keywords : Science & Technology, Physical Sciences, Physics, Applied, Physics, PHYSICS, APPLIED, TETRAHEDRAL AMORPHOUS-CARBON, THIN-FILMS, BONDING MODIFICATIONS, DEFECT DENSITY, NITRIDE, RAMAN, SPECTROSCOPY, REDUCTION, EMISSION, SPECTRA
Related URLs :
Depositing User : Mr Adam Field
Date Deposited : 27 May 2010 14:09
Last Modified : 17 Jan 2015 14:45
URI: http://epubs.surrey.ac.uk/id/eprint/463

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