Near edge x-ray absorption fine structure study of aligned pi-bonded carbon structures in nitrogenated ta-C films
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Roy, SS, McCann, R, Papakonstantinou, P, McLaughlin, JA, Kirkman, IW, Bhattacharyya, S and Silva, SRP (2006) Near edge x-ray absorption fine structure study of aligned pi-bonded carbon structures in nitrogenated ta-C films JOURNAL OF APPLIED PHYSICS, 99 (4). ? - ?. ISSN 0021-8979
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Abstract
Polarization dependent studies of near edge x-ray absorption fine structure (NEXAFS) show evidence for the presence of aligned pi-bonded carbon structures and the formation of a nonplanar CN phase in tetrahedral amorphous nitrogenated carbon (ta-CN) films deposited at room temperature. Moreover, the analysis of NEXAFS data as a function of nitrogen concentration and annealing temperature leads to a comprehensive assignment of the local CN bonding configurations in these ta-CN films and suggests an unusual and almost thermally stable nitrogenated carbon structure.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | Science & Technology, Physical Sciences, Physics, Applied, Physics, TETRAHEDRAL AMORPHOUS-CARBON, THIN-FILMS, BONDING MODIFICATIONS, DEFECT DENSITY, NITRIDE, RAMAN, SPECTROSCOPY, REDUCTION, EMISSION, SPECTRA |
| Divisions: | Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Nano-Electronics Centre |
| Related URLs: | |
| ID Code: | 463 |
| Deposited By: | Mr Adam Field |
| Deposited On: | 27 May 2010 15:09 |
| Last Modified: | 16 Feb 2013 15:29 |
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