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Direct x-ray detection with conjugated polymer devices

Boroumand, FA, Zhu, M, Dalton, AB, Keddie, JL, Sellin, PJ and Gutierrez, JJ (2007) Direct x-ray detection with conjugated polymer devices APPLIED PHYSICS LETTERS, 91 (3). ? - ?. ISSN 0003-6951


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The authors report the first direct detection of x-ray induced photocurrents in thick films (up to 20 mu m) of conjugated polymers. Schottky-based "sandwich" structures were fabricated from layers of either poly[1-methoxy-4-(2-ethylhexyloxy)-phenylenevinylene] (MEH-PPV) or poly(9,9-dioctylfluorene) (PFO) on indium tin oxide substrates using a top contact of aluminum. Good rectification was achieved from the Al-polymer contact, with a reverse bias leakage current density as low as 4 nA/cm(2) at an electric field strength of 25 kV/cm. Irradiation with x-rays from a 50 kV x-ray tube produced a linear increase in photocurrent over a dose rate range from 4 to 18 mGy/s. The observed x-ray sensitivities of 240 nC/mGy/cm(3) for MEH-PPV and 480 nC/mGy/cm(3) for PFO structures are comparable to that reported for Si devices. A response time of < 150 ms to pulsed x-ray irradiation was measured with no evidence of long-lived current transients. Conjugated polymers offer the advantage of easy coatability over large areas and on curved surfaces. Their low average atomic number provides tissue-equivalent dosimetric response, with many potential applications including medical x-ray and synchrotron photon detection. (C) 2007 American Institute of Physics.

Item Type: Article
Uncontrolled Keywords: Science & Technology, Physical Sciences, Physics, Applied, Physics, LIGHT-EMITTING-DIODES, ORGANIC SEMICONDUCTORS, MEH-PPV, BRIGHTNESS, TRANSPORT, CHARGE
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Divisions: Faculty of Engineering and Physical Sciences > Physics
Depositing User: Mr Adam Field
Date Deposited: 27 May 2010 14:07
Last Modified: 23 Sep 2013 18:27

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