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An experimental study of charge distribution in crystalline and amorphous Si nanoclusters in thin silica films

Thogersen, A, Diplas, S, Mayandi, J, Finstad, T, Olsen, A, Watts, JF, Mitome, M and Bando, Y (2008) An experimental study of charge distribution in crystalline and amorphous Si nanoclusters in thin silica films JOURNAL OF APPLIED PHYSICS, 103 (2). ? - ?. ISSN 0021-8979

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Abstract

Crystalline and amorphous nanoparticles of silicon in thin silica layers were examined by transmission electron microscopy, electron energy loss spectroscopy, and x-ray photoelectron spectroscopy (XPS). We used XPS data in the form of the Auger parameter to separate initial and final state contributions to the Si-2p energy shift. The electrostatic charging and electron screening issues as well as initial state effects were also addressed. We show that the chemical shift in the nanocrystals is determined by initial state rather than final state effects, and that the electron screening of silicon core holes in nanocrystals dispersed in SiO2 is inferior to that in pure bulk Si.

Item Type: Article
Uncontrolled Keywords: Science & Technology, Physical Sciences, Physics, Applied, Physics, AUGER-PARAMETER SHIFTS, BINDING-ENERGY, SPECTROSCOPIC ANALYSIS, ELECTRONIC-STRUCTURE, SIO2/SI INTERFACE, CORE-ELECTRON, STATE, PHOTOELECTRON, NANOCRYSTALS, DEPENDENCE
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Divisions: Faculty of Engineering and Physical Sciences > Mechanical Engineering Sciences
Depositing User: Mr Adam Field
Date Deposited: 27 May 2010 14:07
Last Modified: 23 Sep 2013 18:27
URI: http://epubs.surrey.ac.uk/id/eprint/269

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