Pulsed laser deposited tetrahedral amorphous carbon with high sp(3) fractions and low optical bandgaps
Miyajima, Y, Henley, SJ, Adamopoulos, G, Stolojan, V, Garcia-Caurel, E, Drevillon, B, Shannon, JM and Silva, SRP (2009) Pulsed laser deposited tetrahedral amorphous carbon with high sp(3) fractions and low optical bandgaps JOURNAL OF APPLIED PHYSICS, 105 (7), ARTN 0.
pulsed_laser_deposited_SILVA_09.pdf - Version of Record
Amorphous carbon films with sp3 bonded carbon fractions over 70% are deposited by pulsed laser deposition. However, the optical bandgap obtained from optical transmittance and spectroscopic ellipsometry analysis shows the values to be below 1.0 eV. A wide range of measurements such as electron energy loss spectroscopy, visible Raman, spectroscopic ellipsometry, optical transmittance, and electrical characterization are performed to elucidate the bonding configurations that dictate microstructural, optical and electrical properties, and their linkage to band structure changes. It is found that stress-induced electronic localized states play an important role in the physical properties of the films deposited. The optical bandgap is shown not to be a good measure of the electrical bandgap, especially for high electric field conduction in these tetrahedral amorphous carbon films.
|Divisions :||Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Nano-Electronics Centre|
|Date :||1 April 2009|
|Identification Number :||https://doi.org/10.1063/1.3095667|
|Uncontrolled Keywords :||Science & Technology, Physical Sciences, Physics, Applied, Physics, DIAMOND-LIKE CARBON, ELECTRON-ENERGY-LOSS, THIN-FILMS, LOSS SPECTROSCOPY, CONDUCTION MECHANISM, RAMAN-SPECTRA, DENSITY, SILICON, NITRIDE, STRESS|
|Related URLs :|
|Depositing User :||Melanie Hughes|
|Date Deposited :||21 Oct 2010 15:32|
|Last Modified :||23 Sep 2013 18:39|
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