Stress-induced electron emission from nanocomposite amorphous carbon thin films
Poa, CH, Lacerda, RG, Cox, DC, Silva, SRP and Marques, FC (2002) Stress-induced electron emission from nanocomposite amorphous carbon thin films APPLIED PHYSICS LETTERS, 81 (5). 853 - 855. ISSN 0003-6951
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Official URL: http://apl.aip.org/resource/1/applab/v81/i5/p853_s...
Traditionally, the emission of electrons from materials have been explained using either the Fowler– Nordheim emission mechanism where high electric fields are used to extract electrons from surfaces or using conventional thermal emission where high currents are used to ‘‘boil’’ off electrons to vacuum. In this letter, we propose an alternative mechanism for electron emission from highly compressive thin films based on stress-induced ‘‘band structure’’ modification of nano-ordered sp2 regions in the thin films. Experimental results are recorded which show that the localized compressive stress governs electron emission in the amorphous carbon thin films studied here rather than the surface nanostructures/features or the diamond-like sp3 hybridized bond component. This analysis is in agreement with the concept of an internal or nongeometric field enhancement from sp2 nanostructures giving rise to high dielectric inhomogeneity within the carbon thin film. The results presented could be extended to explain the anomalous field emission behavior of carbon nanotubes.
|Uncontrolled Keywords:||Science & Technology, Physical Sciences, Physics, Applied, Physics, FIELD-EMISSION, DEPOSITED DIAMOND, HIGH-PRESSURE, CATHODES, GRAPHITE, SURFACE|
|Divisions:||Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Nano-Electronics Centre|
|Deposited By:||Melanie Hughes|
|Deposited On:||19 Oct 2010 10:07|
|Last Modified:||25 May 2013 14:48|
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