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Trace element profiling of gunshot residues by PIXE and SEM-EDS: a feasibility study

Bailey, MJ, Kirkby, KJ and Jeynes, C (2009) Trace element profiling of gunshot residues by PIXE and SEM-EDS: a feasibility study In: 13th European X-Ray Spectrometry Conference (EXRS 2008), 2008-06-16 - 2008-06-20, Cavtat, CROATIA.

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Item Type: Conference or Workshop Item (Conference Paper)
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Ion Beam Centre
Authors :
AuthorsEmailORCID
Bailey, MJUNSPECIFIEDUNSPECIFIED
Kirkby, KJUNSPECIFIEDUNSPECIFIED
Jeynes, CUNSPECIFIEDUNSPECIFIED
Date : 1 May 2009
Identification Number : 10.1002/xrs.1142
Contributors :
ContributionNameEmailORCID
PublisherJOHN WILEY & SONS LTD, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Spectroscopy, UNIVERSAL CORRECTION PROCEDURE, ELECTRON-PROBE MICROANALYSIS, FACILITY
Related URLs :
Additional Information : This is the accepted version of the following article: M. J. Bailey, K. J. Kirkby and C. Jeynes, (2009) Trace element profiling of gunshot residues by PIXE and SEM-EDS: a feasibility study. X-Ray Spectrometry - Special Issue: EXRS 2008 - European Conference on X-Ray Spectrometry. Volume 38, Issue 3, pages 190–194, which has been published in final form at http://dx.doi.org/10.1002/xrs.1142
Depositing User : Symplectic Elements
Date Deposited : 07 Jan 2015 10:35
Last Modified : 07 Jan 2015 14:33
URI: http://epubs.surrey.ac.uk/id/eprint/202009

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