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Characterisation of gunshot residue particles using self-consistent ion beam analysis

Bailey, MJ and Jeynes, C (2009) Characterisation of gunshot residue particles using self-consistent ion beam analysis NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 267 (12-13). pp. 2265-2268.

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Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Ion Beam Centre
Authors :
AuthorsEmailORCID
Bailey, MJUNSPECIFIEDUNSPECIFIED
Jeynes, CUNSPECIFIEDUNSPECIFIED
Date : 15 June 2009
Identification Number : 10.1016/j.nimb.2009.03.031
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Instruments & Instrumentation, Nuclear Science & Technology, Physics, Atomic, Molecular & Chemical, Physics, Nuclear, Physics, PIXE, RBS, EBS, Gunshot residue, Simulated annealing, SIMULTANEOUS PIXE
Related URLs :
Additional Information : NOTICE: this is the author’s version of a work that was accepted for publication in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 267(12-13), June 2009, DOI 10.1016/j.nimb.2009.03.031.
Depositing User : Symplectic Elements
Date Deposited : 06 Jan 2015 12:06
Last Modified : 06 Jan 2015 14:33
URI: http://epubs.surrey.ac.uk/id/eprint/202005

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