Effects of virtual development on product quality: exploring defect causes
Jacobs, J. C., van Moll, J. H., Krause, P. J., Kusters, R. J. and Trienekens, J. J. M. (2003) Effects of virtual development on product quality: exploring defect causes In: Eleventh Annual International Workshop on Software Technology and Engineering Practice.
This paper explores the effects of virtual development on product quality, from the viewpoint of "conformance to specifications". Specifically, causes of defect injection and non- or late-detection are explored. Because of the practical difficulties of obtaining hard project-specific defect data, an approach was taken that relied upon accumulated expert knowledge. The accumulated expert knowledge based approach was found to be a practical alternative to an in-depth defect causal analysis on a per-project basis. Defect injection causes seem to be concentrated in the requirements specification phases. Defect dispersion is likely to increase, as requirements specifications are input for derived requirements specifications in multiple, related sub-projects. Similarly, a concentration of causes for the non- or late detection of defects was found in the Integration Test phases. Virtual development increases the likelihood of defects in the end product because of the increased likelihood of defect dispersion, because of new virtual development related defect causes, and because causes already existing in co-located development are more likely to occur.
|Item Type:||Conference or Workshop Item (UNSPECIFIED)|
|Divisions :||Faculty of Engineering and Physical Sciences > Computing Science|
|Date :||19 September 2003|
|Identification Number :||https://doi.org/10.1109/STEP.2003.8|
|Uncontrolled Keywords :||Virtual development, Product Quality, Defect injection, Defect detection, Defect Causal Analysis|
|Additional Information :||Proceedings of the Eleventh Annual International Workshop on Software Technology and Engineering Practice (STEP’04), pp. 6-15.© 2004 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.|
|Depositing User :||Mr Adam Field|
|Date Deposited :||27 May 2010 14:46|
|Last Modified :||23 Sep 2013 18:36|
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