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A novel wavelet stereo matching method to improve DEM accuracygenerated from SPOT stereo image pairs

Xia, Yan, Ho, Anthony T. S. and Ji, YanWen (2001) A novel wavelet stereo matching method to improve DEM accuracygenerated from SPOT stereo image pairs In: IGARSS 2001. Scanning the Present and Resolving the Future. Proceedings. IEEE 2001 International Geoscience and Remote Sensing Symposium (Cat. No.01CH37217).


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This paper presents a novel stereo matching algorithm using wavelets to obtain a dense disparity model for DEM generation from complex SPOT stereo image pairs of a region in Hong Kong. The SPOT stereo images are first adjusted to derive the corresponding epipolar image pairs such that the matching points lie on the corresponding epipolar lines of the two images. A new edge detector based on bi-orthogonal wavelets is then used to extract the minima images from the epipolar image pairs. The edge features and the dense disparity estimate are derived from the minima images using a novel hybrid stereo matching (HSM) method that combines both feature-based and area-based approaches. Incorporating the dense disparity estimate, HSM then generates a final dense disparity map using the epipolar image pairs. The results obtained indicate that this algorithm can improve 3-D topographic accuracy better than four pixels with a fewer number of control points needed.

Item Type: Conference or Workshop Item (UNSPECIFIED)
Divisions : Faculty of Engineering and Physical Sciences > Computing Science
Authors :
Xia, Yan
Ho, Anthony T.
Ji, YanWen
Date : 9 July 2001
DOI : 10.1109/IGARSS.2001.978327
Additional Information : IEEE 2001 International Geoscience and Remote Sensing Symposium, 2001. IGARSS '01, Vol. 7, 3277-3279. © 2001 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This article was published when Anthony T. S. Ho was at Nanyang Technological University, Singapore.
Depositing User : Mr Adam Field
Date Deposited : 27 May 2010 14:45
Last Modified : 16 Jan 2019 16:23

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