Wavelength dependence of catastrophic optical damage threshold in 980nm semiconductor diode lasers
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Lock, D, Sweeney, SJ and Adams, AR (2003) Wavelength dependence of catastrophic optical damage threshold in 980nm semiconductor diode lasers In: 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003-10-27 - 2003-10-30, TUCSON, AZ.
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Abstract
We investigate the wavelength dependence of the catastrophic optical damage current in 980nm lasers. Using high pressure and low temperature techniques, we find an intrinsic dependence of this threshold on wavelength.
| Item Type: | Conference or Workshop Item (UNSPECIFIED) |
|---|---|
| Uncontrolled Keywords: | Science & Technology, Technology, Physical Sciences, Engineering, Electrical & Electronic, Optics, Engineering |
| Divisions: | Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Photonics |
| Related URLs: | |
| ID Code: | 1797 |
| Deposited By: | Mr Adam Field |
| Deposited On: | 27 May 2010 15:44 |
| Last Modified: | 26 Oct 2012 17:14 |
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