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Infrared ellipsometry of interdiffusion in thin films of miscible polymers

Duckworth, P, Richardson, H, Carelli, C and Keddie, JL (2005) Infrared ellipsometry of interdiffusion in thin films of miscible polymers SURFACE AND INTERFACE ANALYSIS, 37 (1). pp. 33-41.

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Abstract

A new application of infrared ellipsometry is reported. Specifically, the interdiffusion between thin films of miscible polymers - poly(methyl methacrylate) and poly(vinylidene fluoride) - is detected in a non-invasive measurement. A novel technique of data analysis for interdiffusion was developed and is described. The validity of the approach is supported by simulations of diffusion in a bilayer. The onset of extensive interdiffusion over a time period of 15 min occurs at a temperature of 160°C. At a temperature of 190°C, the data show that complete mixing of a bilayer (850 nm thick) occurs within 30s, which is consistent with previously reported values of the mutual diffusion coefficient. Infrared ellipsometry is non-invasive, applicable at elevated temperatures and relatively fast and sensitive. Although, in these measurements, it was unable to determine a concentration profile at the interface, infrared ellipsometry was used successfully to detect when interdiffusion had occurred. Hence, it is a useful means for screening polymer pairs for miscibility. Copyright © 2004 John Wiley & Sons, Ltd.

Item Type: Article
Subjects : Physics
Divisions : Faculty of Engineering and Physical Sciences > Physics
Authors :
AuthorsEmailORCID
Duckworth, PUNSPECIFIEDUNSPECIFIED
Richardson, HUNSPECIFIEDUNSPECIFIED
Carelli, CUNSPECIFIEDUNSPECIFIED
Keddie, JLUNSPECIFIEDUNSPECIFIED
Date : 1 January 2005
Identification Number : 10.1002/sia.2003
Copyright Disclaimer : This is the peer reviewed version of the following article: Duckworth, P, Richardson, H, Carelli, C and Keddie, JL (2005) Infrared ellipsometry of interdiffusion in thin films of miscible polymers SURFACE AND INTERFACE ANALYSIS, 37 (1). 33 - 41, which has been published in final form at http://dx.doi.org/10.1002/sia.2003. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Self-Archiving.
Uncontrolled Keywords : Science & Technology, Physical Sciences, Chemistry, Physical, Chemistry, CHEMISTRY, PHYSICAL, interfaces, infrared, ellipsometry, thin films, diffusion, miscible, PVDF, PMMA, CONFOCAL RAMAN MICROSPECTROSCOPY, ANGLE X-RAY, POLY(VINYLIDENE FLUORIDE), POLY(METHYL METHACRYLATE), NEUTRON REFLECTION, CROSS-LINKING, SPECTROSCOPIC ELLIPSOMETRY, POLY(DIMETHYL SILOXANE), MUTUAL DIFFUSION, INTERFACES
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Additional Information : This is the peer reviewed version of the following article: Duckworth, P, Richardson, H, Carelli, C and Keddie, JL (2005) Infrared ellipsometry of interdiffusion in thin films of miscible polymers SURFACE AND INTERFACE ANALYSIS, 37 (1). 33 - 41, which has been published in final form at http://dx.doi.org/10.1002/sia.2003. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Self-Archiving.
Depositing User : Symplectic Elements
Date Deposited : 23 Feb 2016 18:23
Last Modified : 23 Feb 2016 18:23
URI: http://epubs.surrey.ac.uk/id/eprint/158568

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