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Josephson effects in MgB2 metal masked ion damage junctions

Kang, DJ, Peng, NH, Jeynes, C, Webb, R, Lee, HN, Oh, B, Moon, SH, Burnell, G, Stelmashenko, NA, Tarte, EJ, Moore, DF and Blamire, MG (2003) Josephson effects in MgB2 metal masked ion damage junctions In: Applied Superconductivity Conference, 2002-08-04 - 2002-08-09, HOUSTON, TEXAS.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Uncontrolled Keywords: Science & Technology, Technology, Physical Sciences, Engineering, Electrical & Electronic, Physics, Applied, Engineering, Physics, ENGINEERING, ELECTRICAL & ELECTRONIC, PHYSICS, APPLIED, focused ion beam, ion implantation, Josephson effects, nanotechnology, MAGNESIUM-DIBORIDE, THIN-FILMS, YBA2CU3O7-DELTA, IMPLANTATION, IRRADIATION, BEAM
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Divisions: Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Ion Beam Centre
Depositing User: Mr Adam Field
Date Deposited: 27 May 2010 14:39
Last Modified: 09 Jun 2014 13:27
URI: http://epubs.surrey.ac.uk/id/eprint/1280

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