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Josephson effects in MgB2 metal masked ion damage junctions

Kang, DJ, Peng, NH, Jeynes, C, Webb, R, Lee, HN, Oh, B, Moon, SH, Burnell, G, Stelmashenko, NA, Tarte, EJ, Moore, DF and Blamire, MG (2003) Josephson effects in MgB2 metal masked ion damage junctions In: Applied Superconductivity Conference, 2002-08-04 - 2002-08-09, HOUSTON, TEXAS.

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Ion Beam Centre
Authors :
AuthorsEmailORCID
Kang, DJUNSPECIFIEDUNSPECIFIED
Peng, NHUNSPECIFIEDUNSPECIFIED
Jeynes, CUNSPECIFIEDUNSPECIFIED
Webb, RUNSPECIFIEDUNSPECIFIED
Lee, HNUNSPECIFIEDUNSPECIFIED
Oh, BUNSPECIFIEDUNSPECIFIED
Moon, SHUNSPECIFIEDUNSPECIFIED
Burnell, GUNSPECIFIEDUNSPECIFIED
Stelmashenko, NAUNSPECIFIEDUNSPECIFIED
Tarte, EJUNSPECIFIEDUNSPECIFIED
Moore, DFUNSPECIFIEDUNSPECIFIED
Blamire, MGUNSPECIFIEDUNSPECIFIED
Date : 1 June 2003
Identification Number : 10.1109/TASC.2003.814157
Contributors :
ContributionNameEmailORCID
PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, UNSPECIFIEDUNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Physical Sciences, Engineering, Electrical & Electronic, Physics, Applied, Engineering, Physics, ENGINEERING, ELECTRICAL & ELECTRONIC, PHYSICS, APPLIED, focused ion beam, ion implantation, Josephson effects, nanotechnology, MAGNESIUM-DIBORIDE, THIN-FILMS, YBA2CU3O7-DELTA, IMPLANTATION, IRRADIATION, BEAM
Related URLs :
Depositing User : Mr Adam Field
Date Deposited : 27 May 2010 14:39
Last Modified : 17 Jan 2015 14:56
URI: http://epubs.surrey.ac.uk/id/eprint/1280

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