University of Surrey

Test tubes in the lab Research in the ATI Dance Research

The lifetime distribution of excess carriers in H+ ion implanted silicon by photoconductive frequency resolved spectroscopy

Niby, MA, Li, DQ, Lourenco, MA, Nejim, A, Homewood, KP, Hemment, PLF, Ishidida, E, Current, M, Banerjee, S, Larson, L, Mehta, S, Tasch, A, Smith, TC and Romig, T (1997) The lifetime distribution of excess carriers in H+ ion implanted silicon by photoconductive frequency resolved spectroscopy ION IMPLANTATION TECHNOLOGY - 96. 668 - 671.

[img]
Preview
PDF
fulltext.pdf

Download (325kB)
Item Type: Article
Divisions : Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Ion Beam Centre
Authors :
AuthorsEmail
Niby, MAUNSPECIFIED
Li, DQUNSPECIFIED
Lourenco, MAUNSPECIFIED
Nejim, AUNSPECIFIED
Homewood, KPUNSPECIFIED
Hemment, PLFUNSPECIFIED
Ishidida, EUNSPECIFIED
Current, MUNSPECIFIED
Banerjee, SUNSPECIFIED
Larson, LUNSPECIFIED
Mehta, SUNSPECIFIED
Tasch, AUNSPECIFIED
Smith, TCUNSPECIFIED
Romig, TUNSPECIFIED
Date : 1 January 1997
Contributors :
ContributionNameEmail
PublisherI E E E, UNSPECIFIED
Uncontrolled Keywords : Science & Technology, Technology, Engineering, Electrical & Electronic, Materials Science, Multidisciplinary, Engineering, Materials Science
Related URLs :
Depositing User : Mr Adam Field
Date Deposited : 27 May 2010 14:39
Last Modified : 17 Jan 2015 14:36
URI: http://epubs.surrey.ac.uk/id/eprint/1258

Actions (login required)

View Item View Item

Downloads

Downloads per month over past year


Information about this web site

© The University of Surrey, Guildford, Surrey, GU2 7XH, United Kingdom.
+44 (0)1483 300800