Modeling of High-Current Source-Gated Transistors in Amorphous Silicon
Balon, F, Shannon, J M and Sealy, B J (2005) Modeling of High-Current Source-Gated Transistors in Amorphous Silicon Applied Physics Letters, 86 (7).
Official URL: http://dx.doi.org/10.1063/1.1865358
Compared with the field-effect transistor, the source-gated transistor has a much lower saturation voltage and higher output impedance. These features are investigated using computer modeling for amorphous silicon transistors operated at high currents when source barriers are low. In particular, it is shown that low saturation voltages are maintained at high current and are insensitive to source-drain separation. Furthermore, the output impedance is preserved even for submicron source-drain separations.
Published in Applied Physics Letters, Vol. 86, Iss. 7.
Copyright 2005 American Institute of Physics. Click here to access the journal's website.
|Divisions:||Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Ion Beam Centre|
|Deposited By:||Mr Adam Field|
|Deposited On:||27 May 2010 15:05|
|Last Modified:||20 Sep 2012 13:15|
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