"total IBA" - Where are we?
Jeynes, C, Bailey, MJ, Bright, NJ, Christopher, ME, Grime, GW, Jones, BN, Palitsin, VV and Webb, RP (2012) "total IBA" - Where are we? Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 271. 107 - 118. ISSN 0168-583X
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The suite of techniques which are available with the small accelerators used for MeV ion beam analysis (IBA) range from broad beams, microbeams or external beams using the various particle and photon spectrometries (including RBS, EBS, ERD, STIM, PIXE, PIGE, NRA and their variants), to tomography and secondary particle spectrometries like MeV-SIMS. These can potentially yield almost everything there is to know about the 3-D elemental composition of types of samples that have always been hard to analyse, given the sensitivity and the spacial resolution of the techniques used. Molecular and chemical information is available in principle with, respectively, MeV-SIMS and high resolution PIXE. However, these techniques separately give only partial information – the secret of “Total IBA” is to find synergies between techniques used simultaneously which efficiently give extra information. We here review how far “Total IBA” can be considered already a reality, and what further needs to be done to realise its full potential.
|Additional Information:||NOTICE: this is the author’s version of a work that was accepted for publication in Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 271, Ocyoberber 2011, DOI 10.1016/j.nimb.2011.09.020.|
|Divisions:||Faculty of Engineering and Physical Sciences > Electronic Engineering > Advanced Technology Institute > Ion Beam Centre|
|Depositing User:||Symplectic Elements|
|Date Deposited:||08 Feb 2012 16:26|
|Last Modified:||23 Sep 2013 18:59|
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