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Investigation of the internal electric field distribution under in situ x-ray irradiation and under low temperature conditions by the means of the Pockels effect

Prekas, G, Sellin, PJ, Veeramani, P, Davies, AW, Lohstroh, A, Ozsan, ME and Veale, MC (2010) Investigation of the internal electric field distribution under in situ x-ray irradiation and under low temperature conditions by the means of the Pockels effect JOURNAL OF PHYSICS D-APPLIED PHYSICS, 43 (8), ARTN 0.

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Item Type: Article
Authors :
AuthorsEmailORCID
Prekas, GUNSPECIFIEDUNSPECIFIED
Sellin, PJUNSPECIFIEDUNSPECIFIED
Veeramani, PUNSPECIFIEDUNSPECIFIED
Davies, AWUNSPECIFIEDUNSPECIFIED
Lohstroh, AUNSPECIFIEDUNSPECIFIED
Ozsan, MEUNSPECIFIEDUNSPECIFIED
Veale, MCUNSPECIFIEDUNSPECIFIED
Date : 3 March 2010
Identification Number : https://doi.org/10.1088/0022-3727/43/8/085102
Uncontrolled Keywords : Science & Technology, Physical Sciences, Physics, Applied, Physics, CADMIUM ZINC TELLURIDE, TRANSPORT-PROPERTIES, RADIATION DETECTORS, CDTE, CHARGE
Related URLs :
Depositing User : Symplectic Elements
Date Deposited : 28 Mar 2017 14:59
Last Modified : 28 Mar 2017 14:59
URI: http://epubs.surrey.ac.uk/id/eprint/102444

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